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New Patent Examination System Considered

Posted Friday, June 4, 2010 by Jim Ruttler

A new three tiered system of examination is being considered by the Patent Office and could be implemented as soon as early 2011. The system would provide applicants an option to select slow, medium, and fast examination speeds. Currently, all applications are examined on a first-come, first-serve basis. The new system would allow applicants to decide early on whether they wanted quicker issuance or whether further delays were tolerable. More information can be found at:

New Patent Examination System Considered ›› Ruttler Mills PLLC