New Patent Examiner Reward System
Posted Thursday, October 1, 2009 by Jim Ruttler
The US Patent Office has released an update to the Examiners providing details on the new reward system. The system will incentivize examiners to identify allowable subject matter on the first office action and should reduce overall pendency of applications. Further, there will be a new formal policy of requiring examination on a first-in first-out basis. This is excellent news for applicants as these policies should help provide more compact examination and earlier allowance for truly novel inventions.